教師資料

劉俊杰 Juin J. Liou
職稱
榮譽講座教授
學歷
美國佛羅里達大學 電機博士
電子郵件
辦公室

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研究領域 1. Micro/nanoelectronics computer-aided design 2. RF device modeling and simulation 3. electrostatic discharge (ESD) protection design and simulation
開授課程

2018 ~  現在 中國鄭州大學講座教授
1997 ~  2018 Professor at University of Central Florida
1991 ~  1997 Associate Professor at University of Central Florida


2009 UCF Pegasus Professor
2009 UCF Distinguished Researcher Award
2005 UCF Research Incentive Award
2004 IEEE Joseph M. Biedenbach Outstanding Engineering Educator Award
2002 UCF Trustee Chair Professor

研究成果
  [1]   Bagus Haryadi, Juin J. Liou, Hai-Cheng Wei, Ming-Xia Xiao, Hsien-Tsai Wu, Cheuk-Kwan Sun: Application of multiscale Poincar? short-time computation versus multiscale entropy in analyzing fingertip photoplethysmogram amplitudes to differentiate diabetic from non-diabetic subjects. Computer Methods and Programs in Biomedicine 166: 115-121 (2018)
  [2]   Zhaonian Yang, Yuan Yang, Ningmei Yu, Juin J. Liou: Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. Microelectronics Journal 78: 88-93 (2018)
  [3]   Chuan-Hsi Liu, Chun-Hu Cheng, Chin-Pao Cheng, Juin J. Liou: Editorial: IEDMS 2016. Microelectronics Reliability 83: 207 (2018)
  [4]   Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou: A double snapback SCR ESD protection scheme for 28?nm CMOS process. Microelectronics Reliability 84: 20-25 (2018)
  [5]   Adelmo Ortiz-Conde, Andrea Sucre-Gonz?lez, Fabi?n Z?rate-Rinc?n, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. Garc?a-S?nchez: A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectronics Reliability 69: 1-16 (2017)
  [6]   Fan Liu, Zhiwei Liu, Jizhi Liu, Cheng Hui, Zhao Liu, Tian Rui, Shiyu Song, Juin J. Liou: A novel vertical SCR for ESD protection in 40 V HV bipolar process. Microelectronics Reliability 78: 307-310 (2017)
  [7]   Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong (Paul) Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou: ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. Microelectronics Reliability 79: 201-205 (2017)
  [8]   Weihuai Wang, Hao Jin, Wei Guo, Shurong Dong, Wei Liang, Juin J. Liou, Yan Han: Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28 nm processing. Microelectronics Reliability 61: 106-110 (2016)
  [9]   Wei Liang, Aihua Dong, Hang Li, Meng Miao, Chung-Chen Kuo, Maxim Klebanov, Juin J. Liou: Characteristics of ESD protection devices operated under elevated temperatures. Microelectronics Reliability 66: 46-51 (2016)
  [10]   Meng Miao, Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou:Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. Microelectronics Reliability 55(1): 15-23 (2015)
  [1]   Nan-Xiong Huang, Hsi Rong Han, Wen Tui Liao, Chih-Hung Huang, Wen Chun Wang, Miin-Shyue Shiau, Ching-Hwa Cheng, Hong-Chong Wu, Heng-Shou Hsu, Juin J. Liou, Shry-Sann Liao, Ruei-Cheng Sun, Guang-Bao Lu, Don-Gey Liu: Integrated amorphous-Si TFT circuits for gate drivers on LCD panels. ASICON 2013: 1-4
  [2]   Juin J. Liou: Challenges on designing electrostatic discharge protection solutions for low power electronics. ISLPED 2013: 248
  [3]   Juin J. Liou, Chang Jiang, Feng Chia: Electrostatic discharge (ESD) protection of RF integrated circuits. APCCAS 2012: 460-462
  [4]   Juin J. Liou, Chang Jiang, Cao Guang-Biao, Chang Gung, Feng Chia: Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology. ASICON 2011: 256-258
  [5]   Javier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner: Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip. ISCAS (1) 2005: 416-419
  [6]   Q. Zhang, Juin J. Liou, John McMacken, Kevin Stiles, J. Ross Thomson, Paul Layman: An efficient and practical MOS statistical model for digital applications. ISCAS 2000: 433-436
  [1]   Analysis and design of MOSFETs, By Juin Liou, 1998, 349 Pages.

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