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[1]
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Bagus Haryadi, Juin J. Liou, Hai-Cheng Wei, Ming-Xia Xiao, Hsien-Tsai Wu, Cheuk-Kwan Sun:
Application of multiscale Poincar? short-time computation versus multiscale entropy in analyzing fingertip photoplethysmogram amplitudes to differentiate diabetic from non-diabetic subjects. Computer Methods and Programs in Biomedicine 166: 115-121 (2018)
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[2]
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Zhaonian Yang, Yuan Yang, Ningmei Yu, Juin J. Liou:
Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. Microelectronics Journal 78: 88-93 (2018)
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[3]
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Chuan-Hsi Liu, Chun-Hu Cheng, Chin-Pao Cheng, Juin J. Liou:
Editorial: IEDMS 2016. Microelectronics Reliability 83: 207 (2018)
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[4]
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Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou:
A double snapback SCR ESD protection scheme for 28?nm CMOS process. Microelectronics Reliability 84: 20-25 (2018)
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[5]
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Adelmo Ortiz-Conde, Andrea Sucre-Gonz?lez, Fabi?n Z?rate-Rinc?n, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. Garc?a-S?nchez:
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectronics Reliability 69: 1-16 (2017)
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[6]
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Fan Liu, Zhiwei Liu, Jizhi Liu, Cheng Hui, Zhao Liu, Tian Rui, Shiyu Song, Juin J. Liou:
A novel vertical SCR for ESD protection in 40 V HV bipolar process. Microelectronics Reliability 78: 307-310 (2017)
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[7]
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Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong (Paul) Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou:
ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. Microelectronics Reliability 79: 201-205 (2017)
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[8]
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Weihuai Wang, Hao Jin, Wei Guo, Shurong Dong, Wei Liang, Juin J. Liou, Yan Han:
Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28 nm processing. Microelectronics Reliability 61: 106-110 (2016)
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[9]
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Wei Liang, Aihua Dong, Hang Li, Meng Miao, Chung-Chen Kuo, Maxim Klebanov, Juin J. Liou:
Characteristics of ESD protection devices operated under elevated temperatures. Microelectronics Reliability 66: 46-51 (2016)
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[10]
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Meng Miao, Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou:Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. Microelectronics Reliability 55(1): 15-23 (2015) |
