教師資料

Randall Geiger Randall Geiger
職稱
榮譽講座教授
學歷
美國科羅拉多州立大學博士
電子郵件
rlgeiger@iastate.edu
辦公室
Room 351 Durham, Dept. ECE, Iowa St

Office Hours
電話
傳真
個人網頁 http://class.ece.iastate.edu/rlgeiger/
實驗室
研究領域 類比/混合模式VLSI設計、ADC/DAC設計與測試、IC佈局優化與良率提升
開授課程



2005 IEEE 會士委員會委員
2002 Willard and Leitha Richardson講座教授
2000 IEEE 千禧獎章
2000 IEEE 電路與系統社群二五十年金獎
1996 IEEE 電路與系統社群優良服務獎
1993 IEEE Periodicals Council主席
1992 IEEE 電路與系統社群主席
1990 IEEE 會士

研究成果
  [1]   Le Jin; Haggag, H.; Geiger, R.L.; Degang Chen, “Testing of Precision DAC Using Low-Resolution ADC With Wobbling,” IEEE Trans on Instr. and Measurement, Vol. 57, pp. 940 - 946, May 2008.
  [2]   He, C.; Jin, L.; Chen, D.; Geiger, R.; “Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques,” IEEE Trans. on Circuits and Systems I, Vol. 54, pp. 964 - 973, May 2007.
  [3]   Hanjun Jiang; Olleta, B.; Degang Chen; Geiger, R.L., “Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs,” IEEE Trans on Instr. and Measurement, Vol. 56, pp. 1753 - 1762, Oct. 2007.
  [4]   Le Jin; Degang Chen; Geiger, R.L., “SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving,” IEEE Trans on Instr. and Measurement, vol. 56, pp. 1776 - 1785, Oct. 2007.
  [5]   Y. Lin, D. Chen and R.L. Geiger “Yield Enhancement With Optimal Area Allocation for Ratio-Critical Analog Circuits”, IEEE Trans. on Circuits and Systems I, Vol 53, pp. 534-553, March 2006.
  [6]   Oletta, B., Jiang, H. Chen, D.J. and Geiger, R.L. “A Deterministic Dynamic Element Matching Approach for Testing High Resolution ADCs with Low Accuracy Excitations”, IEEE Trans on Instr. and Measurement, Vol. 55, pp. 902 – 915, June 2006.
  [1]   Hanqing Xing, Degang Chen, Geiger R., Le Jin,"System identification -based reduced-code testing for pipeline ADCs’linearity test", IEEE International Symposium on Circuits and Systems,pp.2402-2405 ,May 2008
  [2]   Hanqing Xing, Degang Chen, Geiger R.,"On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering"",IEEE International Conference on Electro/Information Technology,PP. 117-122,May 2008
  [3]   Sloat J.D., Geiger R.L.,"An inexpensive microelectronic environmental test chamber",IEEE International Conference on Electro/Information Technology,PP. 168-170,May 2008
  [4]   Jun He, Sanyi Zhan, Degang Chen, Geiger R.,"A simple and accurate method to predict offset voltage in dynamic comparators",IEEE International Symposium on Circuits and Systems, pp. 1934-1937, May 2008
  [5]   Katyal V., Geiger R.L., Chen D.J.,"Adjustable hysteresis CMOS Schmitt triggers",IEEE International Symposium on Circuits and Systems, pp. 1938-1941, May 2008
  [6]   Jun He, Geiger. R, Degang Chen,"A detailed analysis of nonideal effects on high precision bandgap voltage references",Midwest Symposium on Circuits and Systems,pp382-385,Aug. 2008
  [7]   Yingkun Gai, Geiger. R, Degang Chen,"Noise analysis in hold phase for switched-capacitor circuits",Midwest Symposium on Circuits and Systems,pp.45-48,Aug. 2008
  [8]   Le Jin, Degang Chen, Geiger R.,"Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal", IEEE VLSI Test Symposium,pp.303-310,May 2007
  [9]   Hanjun Jiang, Degang Chen, Geiger R.L.,"Deterministic DEM DAC Performance Analysis", IEEE International Symposium on Circuits and Systems,pp.3860-3863,May 2007
  [10]   Hanqing Xing, Hanjun Jiang, Degang Chen, Geiger R.,"A fully digital-compatible BIST strategy for ADC linearity testing",IEEE International Test Conference,pp. 1-10,Oct. 2007
  [11]   Hanqing Xing, Le Jin, Degang Chen, Geiger. R, " Characterization of a current-mode bandgap circuit structure for high-precision reference applications", IEEE International Symposium on Circuits and Systems, pp. 4, May 2006
  [12]   Le Jin, Hanqing Xing, Degang Chen, Geiger. R,"A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient", IEEE International Symposium on Circuits and Systems, pp. 4, May 2006
  [13]   Chao Su, Geiger R.L.,"Dynamic calibration of current-steering DAC",IEEE International Symposium on Circuits and Systems,pp.4,May 2006
  [14]   Wada K., Geiger R.L.,"Minimization of total area in integrated active RC filters",IEEE International Symposium on Circuits and Systems,pp.4,May 2006
  [15]   Xin Dai, Degang Chen, Geiger R.,"Explicit characterization of bandgap references",IEEE International Symposium on Circuits and Systems,pp.4,May 2006
  [16]   Yu Lin, Geiger R.,"Unit resistor characterization for matching-critical circuit design",IEEE International Symposium on Circuits and Systems,pp.4,May 2006
  [17]   Fei Haibo, Geiger Randall L.,"Aggressive Area Scaling in Passive Transresistance Networks",IEEE International Midwest Symposium on Circuits and Systems,pp.536 - 539,Aug. 2006
  [18]   Fei Haibo, Geiger Randall L.,"Aggressive Area Scaling in Passive Transresistance Networks", IEEE International Midwest Symposium on Circuits and Systems,pp.536-539,Aug. 2006
  [19]   Le Jin, Degang Chen, Randall Geiger,"Linearity Test of Analog-to-Digital Converters Using Kalman Filtering",IEEE International Test Conference,pp.1 - 9,Oct. 2006
  [20]   Le Jin, Hosam Haggag, Geiger R., Degang Chen,"Testing of Precision DACs Using Low-Resolution ADCs with Dithering",IEEE International Test Conference,pp.1 - 10,Oct. 2006
  [21]   Katyal Vipul, Geiger Randall L., Chen Degang J.,"A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs",IEEE Asia Pacific Conference on Circuits and Systems,pp.5 - 8,Dec. 2006
  [22]   S. Thoka and R.L. Geiger, “Fast-Switching Adaptive Bandwidth Frequency Synthesizer using a Loop Filter with Switched Zero-Resistor Array”, IEEE International Symposium on Circuits and Systems, pp. 5373-5376, Kobe Japan, May 2005.
  [23]   H. Xing, D. Chen, and R.L. Geiger, ”A Two-Step DDEM ADC for Accurate and Cost Effective DAC Testing”, IEEE International Symposium on Circuits and Systems, pp. 4289-4292, Kobe Japan, May 2005.
  [24]   Z. Yu, D. Chen, R.L. Geiger, and Y. Papantonopoulo, “Pipelined ADC Linearity Testing with Dramatically Reduced Capture Time ”, IEEE International Symposium on Circuits and Systems, pp. 792-795, Kobe Japan, May 2005.
  [25]   D. Chen, Z. Yu, and R.L. Geiger, “An Adaptive Truly Background Calibration Method for High Speed Pipeline ADC Design”, IEEE International Symposium on Circuits and Systems, pp. 6190-6193, Kobe Japan, May 2005.
  [26]   W. Liu, H. Xing, L. Jin, R.L. Geiger, and D. Chen, “ A Test Strategy for Time-to-Digital Converters Using Dynamic Element Matching and Dithering”, pp. 3809-3812, IEEE International Symposium on Circuits and Systems, Kobe Japan, May 2005.
  [27]   H. Jiang, B. Olleta, D. Chen, and R.L. Geiger, “ A Segmented Thermometer Coded DAC with Deterministic Dynamic Element Matching for High Resolution ADC Test”, IEEE International Symposium on Circuits and Systems, pp. 784-7887, Kobe Japan, May 2005.
  [28]   L. Jin, D. Chen, and R.L. Geiger, “ A Digital Self-Calibration Algorithm for ADCs Based on Histogram Test Using Low-Linearity Input Signals”, IEEE International Symposium on Circuits and Systems, pp. 1378-1381, Kobe Japan, May 2005.
  [29]   H. Jiang, D. Chen, and R.L. Geiger, “ Dither Incorporated Deterministic Dynamic Element Matching for High Resolution ADC Test Using Extremely Low Resolution DACs, ” IEEE International Symposium on Circuits and Systems, pp. 4285-4288, Kobe Japan, May 2005.
  [30]   X. Dai, C. He, H. Xing, D. Chen, and R.L. Geiger, “ An n-th Order Central Symmetrical Layout Pattern for Nonlinear Gradient Cancellation”, IEEE International Symposium on Circuits and Systems, pp. 4835-4838. Kobe Japan, May 2005.
  [31]   X. Dai, D. Chen, and R.L. Geiger, “ A Cost-Effective Histogram Test-Based Algorithm for Digital Calibration of High-Precision Pipelined ADCs”, IEEE International Symposium on Circuits and Systems, pp. 4831- 4834, Kobe Japan, May 2005.
  [32]   Y. Lin, V. Katyal, M. Schlarmann, and R.L. Geiger, “ kT/C Constrained Optimization of Power in Pipelined ADCs”, IEEE International Symposium on Circuits and Systems, pp. 1968-1971, Kobe Japan, May 2005.
  [33]   V. Katyal, Y. Lin, and R.L. Geiger, “Power Dependence of Feedback Amplifiers on Op Amp Architecture”, IEEE International Symposium on Circuits and Systems, pp. 1618-1621, Kobe Japan, May 2005.
  [34]   Chao Su, Xin Dai and Geiger, R.L., “A novel dynamic calibration approach for current-steering DACS”, Proceedings of the IEEE International Workshop on VLSI Design and Video Technology, pp. 40- 43, Shanghai, May 2005.
  [35]   Parthasarathy, K.m Kuyel, T., Zhongjun Yu, Degang Chen and Geiger, R.L., ”A 16-bit resistor string dac with full-calibration at final test”, IEEE International Test Conference, pp. 66 –75, Nov 2005.
  [36]   Le Jin, Parthasarathy, K., Kuyel, T., Geiger, R and Degang Chen; “High-performance adc linearity test using low-precision signals in non-stationary environments”, IEEE International Test Conference, pp. 1182 – 1191, Nov 2005.
  [37]   Soufi, B.; Malik, S.Q.; Geiger, R.L “A capacitor sharing technique for RSD cyclic ADC”, IEEE Midwest Symposium on Circuits and Systems, pp. 859-862, Cincinnati, Ohio August 2005.
  [38]   Katyal, V., Yu Lin, Geiger, R.L. and Chen, D.J., “Statistical modeling of over-range protection requirement for a switched capacitor inter-stage gain amplifier”, IEEE Midwest Symposium on Circuits and Systems, pp. 1819-1822, Cincinnati, Ohio August 2005.
  [39]   Malik, S.Q.and Geiger, R.L., “Simultaneous capacitor sharing and scaling for reduced power in pipeline ADCs”, IEEE Midwest Symposium on Circuits and Systems, pp. 1015-1018, Cincinnati, Ohio August 2005.
  [40]   Amourah, M.M.; Malik, S.Q.; Geiger, R.L.; “A new design technique for rail-to-rail amplifiers”, IEEE Midwest Symposium on Circuits and Systems, pp. 263-266, Cincinnati, Ohio August 2005.
  [41]   Yu Lin, Katyal, V and Geiger, R.L., “New over-range protection scheme in pipelined data converters” IEEE Midwest Symposium on Circuits and Systems, pp. 283-286, Cincinnati, Ohio August 2005.

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指導學生
學年 論文題目 學生
學年 論文題目 學生
學年 專題題目 學生
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